The JEM-2100 is a multipurpose, 200 kV analytical electron microscope. Variety of versions is provided to adapt user’s purposes. The JEM-2100, which incorporates an integrated PC system for various functions with excellent cost performance, supports research and development in wide scientific fields, for biology to materials researches. Excellent LaB6 electron gun promises excellent performance with a reasonable cost. Ultrahigh TEM resolution as high as 0.19 nm (in UHR configuration) enables us to perform an observation at atomic resolution. STEM (Scanning Transmission Electron Microscope: option) function integrated in PC control system enables us to see a scanning image of a sample at nanometer resolution. EDS (Energy Dispersive X-ray Spectrometer) with a 0.28sr of solid angle (in HR configuration with a 50mm2 detector) performs highly sensitive analysis at nanometer resolution. Highly stable specimen stage enables us to perform a long term observation and analysis.
Control mode select: Key(ex.↑↓→←,wsad,hjkl) Form Gamepad
Use MDS: Yes No
Control mode select: Key(ex.↑↓→←,wsad,hjkl) Form Gamepad
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